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XRD-Mill McCrone

XRD-Mill McCrone
Искане за оферта
техническа информация

Език:

The XRD-Mill McCrone was specially developed for the preparation of samples for subsequent X-ray diffraction (XRD). The mill is used for applications in geology, chemistry, mineralogy and materials science, quality control as well as R&D.
Because of its unique grinding motion, the XRD-Mill McCrone is particularly effective for this analytical method: The 48 cylindrical grinding elements grind the samples gently via friction. The result is a short grinding time with almost no sample loss and an exceptionally narrow particle size distribution. Consequently, the signals in the X-ray diffraction pattern are peak-shaped, with small half-widths, allowing for very good phase analysis.
The crystal lattice structure is largely preserved, with almost no defects, a prerequisite for meaningful X-ray diffraction patterns.
The grinding vessel consists of a 125 ml capacity polypropylene jar fitted with a screw capped gasketless polyethylene closure. The jar is filled with an ordered array of 48 identical cylindrical grinding elements, available in agate, zirconium oxide or corundum. The grinding time for optimum micronization is between 3 and 30 minutes. A typical sample volume is between 2 and 4 ml.
For the preparation of organic samples for a subsequent XRD examination we also offer a hand mortar and pestle made of agate.

Приложение

шисти, бориди, глина, карбиди, керамика, кости, метали, нитриди, полезни изкопаеми, растителни материали, слюда, строителни материали, стъкло, цимент

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The XRD-Mill McCrone carries out size reduction mainly by friction. 48 cylindrical grinding elements are placed into the grinding jar in eight rows of six elements each.
During operation, the jar’s circular motion causes the elements to grind the sample from < 0.5 mm to the low μm-range (typically < 10 μm).
Thanks to the very gentle size reduction process, the crystal lattice of the sample is preserved. This makes the XRD-Mill McCrone the instrument of choice for the sample preparation for subsequent X-ray diffraction analysis.

Function principle

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